"CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations."

Jerry M. Soden et al. (1989)

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DOI: 10.1109/TEST.1989.82325

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins:
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. ITC 1989: 423-430

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