"Zero defects or zero stuck-at faults-CMOS IC process improvement with ..."

Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins (1990)

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DOI: 10.1109/TEST.1990.114026

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins:
Zero defects or zero stuck-at faults-CMOS IC process improvement with I_DDQ. ITC 1990: 255-256

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