"A Fast, Statistical, Machine-learning Approach for Automotive ..."

Mehul D. Shroff, Nguyen Nguyen, Kiran Sunny Thota (2024)

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DOI: 10.1109/ITC51657.2024.00032

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Mehul D. Shroff, Nguyen Nguyen, Kiran Sunny Thota:
A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction. ITC 2024: 129-138

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