"Faster defect localization in nanometer technology based on defective cell ..."

Manish Sharma et al. (2007)

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DOI: 10.1109/TEST.2007.4437604

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann:
Faster defect localization in nanometer technology based on defective cell diagnosis. ITC 2007: 1-10

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