"Combined Array and ADC Structural Test for RRAM-based ..."

Emmanouil Anastasios Serlis et al. (2025)

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DOI: 10.1109/ITC58126.2025.00076

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-24

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Emmanouil Anastasios Serlis, Hanzhi Xun, Emmanouil Arapidis, Anteneh Gebregiorgis, Mottaqiallah Taouil, Said Hamdioui, Moritz Fieback:
Combined Array and ADC Structural Test for RRAM-based Multiply-and-Accumulate Circuits. ITC 2025: 506-509

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