"In-Field Testing using In-System Embedded Deterministic Test as a solution ..."

Varun Sehgal et al. (2025)

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DOI: 10.1109/ITC58126.2025.00063

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Varun Sehgal, Subramanian Mahadevan, Ashrith S. Harith, Mohit Sharma, Saket Goyal, Nilanjan Mukherjee:
In-Field Testing using In-System Embedded Deterministic Test as a solution to alleviate Silent Data Corruption in AI designs. ITC 2025: 454-457

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