"A BIST approach for very deep sub-micron (VDSM) defects."

Yasuo Sato et al. (2000)

> Home

Details and statistics

DOI: 10.1109/TEST.2000.894216

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/SatoINN00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/SatoINN00
Yasuo Sato, Toyohito Ikeya, Michinobu Nakao, Takaharu Nagumo:
A BIST approach for very deep sub-micron (VDSM) defects. ITC 2000: 283-291

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.