"Mainstream ATE: To Reduce LSI and VLSI Test Cost."

Michael W. Salter, Kemon P. Taschioglou (1989)

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DOI: 10.1109/TEST.1989.82345

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Michael W. Salter, Kemon P. Taschioglou:
Mainstream ATE: To Reduce LSI and VLSI Test Cost. ITC 1989: 591-596

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