"Defect screening challenges in the Gigahertz/Nanometer age: keeping up ..."

Mike Rodgers (2000)

> Home

Details and statistics

DOI: 10.1109/TEST.2000.894238

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/Rodgers00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Rodgers00
Mike Rodgers:
Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. ITC 2000: 464-467

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.