"Selecting Close-to-Functional Path Delay Faults for Test Generation."

Irith Pomeranz (2020)

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DOI: 10.1109/ITC44778.2020.9325255

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

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Irith Pomeranz:
Selecting Close-to-Functional Path Delay Faults for Test Generation. ITC 2020: 1-5

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