"SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: ..."

Sujay Pandey et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325240

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-25

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Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee:
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. ITC 2020: 1-10

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