"Fully automated semiconductor operating condition testing."

Thomas Nirmaier, Wolfgang Spirkl, Eric Liau Chee Hong (2006)

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DOI: 10.1109/TEST.2006.297717

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Thomas Nirmaier, Wolfgang Spirkl, Eric Liau Chee Hong:
Fully automated semiconductor operating condition testing. ITC 2006: 1-9

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