"Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures ..."

Suriyaprakash Natarajan et al. (2024)

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DOI: 10.1109/ITC51657.2024.00045

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Suriyaprakash Natarajan, Chaitali S. Oak, Vijay Kakollu, Nipun Chaplot, Soham Roy, Apurva Lonkar, Gerardo J. Perfecto Reyes:
Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor. ITC 2024: 253-260

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