"An ATE architecture for implementing very high efficiency concurrent testing."

Takahiro Nakajima, Takeshi Yaguchi, Hajime Sugimura (2012)

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DOI: 10.1109/TEST.2012.6401551

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Takahiro Nakajima, Takeshi Yaguchi, Hajime Sugimura:
An ATE architecture for implementing very high efficiency concurrent testing. ITC 2012: 1-10

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