"Improved Match-Line Test and Repair Methodology Including Power-Supply ..."

Rahul Nadkarni et al. (2006)

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DOI: 10.1109/TEST.2006.297700

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Rahul Nadkarni, Igor Arsovski, Reid Wistort, Valerie Chickanosky:
Improved Match-Line Test and Repair Methodology Including Power-Supply Noise Testing for Content-Addressable Memories. ITC 2006: 1-9

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