"High throughput non-contact SiP testing."

Brian Moore et al. (2007)

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DOI: 10.1109/TEST.2007.4437595

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky:
High throughput non-contact SiP testing. ITC 2007: 1-10

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