"External Loopback Testing Experiences with High Speed Serial Interfaces."

Anne Meixner et al. (2008)

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DOI: 10.1109/TEST.2008.4700557

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani:
External Loopback Testing Experiences with High Speed Serial Interfaces. ITC 2008: 1-10

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