"Pseudo-Random Low Power Built In Self Test."

Dale Meehl et al. (2025)

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DOI: 10.1109/ITC58126.2025.00048

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Dale Meehl, Sameer Chillarige, Bharath Nandakumar, Carl Wisnesky, Krishna Chakravadhanula:
Pseudo-Random Low Power Built In Self Test. ITC 2025: 392-396

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