"A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low ..."

Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal (2004)

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DOI: 10.1109/TEST.2004.1386942

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Benjamin M. Mauck, Vishnumohan Ravichandran, Usman Azeez Mughal:
A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis. ITC 2004: 105-113

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