"In Search of the Optimum Test Set - Adaptive Test Methods for Maximum ..."

Robert Madge et al. (2004)

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DOI: 10.1109/TEST.2004.1386954

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212

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