"Test yield estimation for analog/RF circuits over multiple correlated ..."

Fang Liu, Erkan Acar, Sule Ozev (2007)

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DOI: 10.1109/TEST.2007.4437643

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Fang Liu, Erkan Acar, Sule Ozev:
Test yield estimation for analog/RF circuits over multiple correlated measurements. ITC 2007: 1-10

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