"Critical path identification and delay tests of dynamic circuits."

Kyung Tek Lee, Jacob A. Abraham (1999)

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DOI: 10.1109/TEST.1999.805764

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kyung Tek Lee, Jacob A. Abraham:
Critical path identification and delay tests of dynamic circuits. ITC 1999: 421-430

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