"Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run."

Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy (2018)

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DOI: 10.1109/TEST.2018.8624678

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-26

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Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy:
Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run. ITC 2018: 1-10

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