"A Fine and Massive Test Methodology for Analyzing Core Characteristics in ..."

Min-Kyu Kim et al. (2025)

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DOI: 10.1109/ITC58126.2025.00024

access: closed

type: Conference or Workshop Paper

metadata version: 2026-03-02

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Min-Kyu Kim, Incheol Nam, Minju Shin, Kyungrak Cho, Gijong Sung, Deasun Kim, Heeil Hong, SangJoon Hwang:
A Fine and Massive Test Methodology for Analyzing Core Characteristics in the Development of Next Generation DRAM. ITC 2025: 181-185

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