"An analysis of the delay defect detection capability of the ECR test method."

Seonki Kim, Sreejit Chakravarty, Bapiraju Vinnakota (2000)

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DOI: 10.1109/TEST.2000.894319

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Seonki Kim, Sreejit Chakravarty, Bapiraju Vinnakota:
An analysis of the delay defect detection capability of the ECR test method. ITC 2000: 1060-1069

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