"A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory ..."

Shuji Kikuchi et al. (1989)

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DOI: 10.1109/TEST.1989.82340

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi:
A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566

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