"All Tests for a Fault Are Not Equally Valuable for Defect Detection."

Rohit Kapur, Jaehong Park, M. Ray Mercer (1992)

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DOI: 10.1109/TEST.1992.527898

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Rohit Kapur, Jaehong Park, M. Ray Mercer:
All Tests for a Fault Are Not Equally Valuable for Defect Detection. ITC 1992: 762-769

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