"A Novel Omnidirectional 3D Test Access Architecture for Advanced ..."

Hiroyuki Iwata et al. (2025)

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DOI: 10.1109/ITC58126.2025.00023

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Hiroyuki Iwata, Sandeep Kumar Goel, Ankita Patidar, Fumiaki Takashima, Frank Lee:
A Novel Omnidirectional 3D Test Access Architecture for Advanced System-on-Wafer (SoW) Applications. ITC 2025: 171-180

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