"Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan ..."

Sebastian Huhn et al. (2025)

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DOI: 10.1109/ITC58126.2025.00031

access: closed

type: Conference or Workshop Paper

metadata version: 2026-01-05

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Sebastian Huhn, Matthias Kampmann, Jan Burchard, Reinhard Meier, Kacper Czerniawski, Lori Schramm, Sandipan Sharma, Nikita Naresh, Wilson Pradeep, Prachi Sinha, Mayank Parasrampuria, Jonathan Gaudet, Martin Keim:
Holistic Validation Pattern Generation for IEEE 1687 and Streaming Scan Networks. ITC 2025: 243-252

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