"Extraction, Simulation and Test Generation for Interconnect Open Defects ..."

Stefan Hillebrecht et al. (2008)

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DOI: 10.1109/TEST.2008.4700642

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng:
Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ITC 2008: 1-10

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