"A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized ..."

Mohamed M. Hafed et al. (2004)

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DOI: 10.1109/TEST.2004.1387335

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sébastien Laberge, Gordon W. Roberts:
A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. ITC 2004: 728-737

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