"Optimizing the Cost of Test at Intel Using per Device Data."

Robert Edmondson, Gregory Iovino, Richard Kacprowicz (2006)

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DOI: 10.1109/TEST.2006.297649

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Robert Edmondson, Gregory Iovino, Richard Kacprowicz:
Optimizing the Cost of Test at Intel Using per Device Data. ITC 2006: 1-8

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