"Scan Strategies for High Quality Latch Array Testing."

Bin Du et al. (2025)

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DOI: 10.1109/ITC58126.2025.00053

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Bin Du, Nehal Patel, Yerong Chen, Jeremy Chin, Katherine Tian:
Scan Strategies for High Quality Latch Array Testing. ITC 2025: 414-417

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