"Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch ..."

Jean Paul Caisso, Bernard Courtois (1988)

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DOI: 10.1109/TEST.1988.207785

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Jean Paul Caisso, Bernard Courtois:
Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101

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