"Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT ..."

Kenneth M. Butler et al. (2004)

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DOI: 10.1109/TEST.2004.1386971

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington:
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364

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