"Design and implementation of a parallel automatic test pattern generation ..."

Robert Butler et al. (2000)

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DOI: 10.1109/TEST.2000.894246

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Robert Butler, Brion L. Keller, Sarala Paliwal, Richard Schoonover, Joseph Swenton:
Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count. ITC 2000: 530-537

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