"Probe contact resistance variations during elevated temperature wafer test."

Jerry J. Broz, Reynaldo M. Rincon (1999)

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DOI: 10.1109/TEST.1999.805761

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jerry J. Broz, Reynaldo M. Rincon:
Probe contact resistance variations during elevated temperature wafer test. ITC 1999: 396-405

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