"Integrated Pin Electronics for a VLSI Test System."

Christopher W. Branson, Don Murray, Steve Sullivan (1988)

> Home

Details and statistics

DOI: 10.1109/TEST.1988.207776

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/BransonMS88
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BransonMS88
Christopher W. Branson, Don Murray, Steve Sullivan:
Integrated Pin Electronics for a VLSI Test System. ITC 1988: 23-27

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.