"LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern ..."

Mohammed Zine E. Brahmi et al. (2025)

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DOI: 10.1109/ITC58126.2025.00020

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Mohammed Zine E. Brahmi, Jennifer Dworak, Martina Perkovic, Megan Appel, Saidapet Ramesh, Ravi J. N, Ramanath Dharmavarm, Arun Kumar Anjaneyareddy, Chen He:
LA-DOS: Layout-Aware-Defect-Oriented Stress UDFM & ATPG Pattern Generation for Zero Defect Automotive Designs. ITC 2025: 141-150

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