"SMART: Scalable and Modular Architecture for Routing-Aware Testing of ..."

Partho Bhoumik et al. (2025)

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DOI: 10.1109/ITC58126.2025.00038

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Partho Bhoumik, Dhruv Thapar, Arjun Chaudhuri, Krishnendu Chakrabarty:
SMART: Scalable and Modular Architecture for Routing-Aware Testing of Fan-out Wafer-Level Packages^*. ITC 2025: 310-319

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