"Efficient combination of trace and scan signals for post silicon ..."

Kanad Basu, Prabhat Mishra, Priyadarsan Patra (2011)

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DOI: 10.1109/TEST.2011.6139157

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Kanad Basu, Prabhat Mishra, Priyadarsan Patra:
Efficient combination of trace and scan signals for post silicon validation and debug. ITC 2011: 1-8

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