"Interconnect Test Pattern Generation Algorithm For Meeting Device and ..."

Kendrick Baker, Mehrdad Nourani (2004)

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DOI: 10.1109/TEST.2004.1386949

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Kendrick Baker, Mehrdad Nourani:
Interconnect Test Pattern Generation Algorithm For Meeting Device and Global SSO Limits With Safe Initial Vectors. ITC 2004: 163-172

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