"Test Data Compression of 100x for Scan-Based BIST."

Masayuki Arai et al. (2006)

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DOI: 10.1109/TEST.2006.297664

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo:
Test Data Compression of 100x for Scan-Based BIST. ITC 2006: 1-10

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