"Logic BIST silicon debug and volume diagnosis methodology."

M. Enamul Amyeen et al. (2011)

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DOI: 10.1109/TEST.2011.6139147

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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M. Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan:
Logic BIST silicon debug and volume diagnosis methodology. ITC 2011: 1-10

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