"Test Bin Entitlement: Yield Outlier Detection using Die Area and LLM based ..."

Ragad Al-Huq, Yuegui Zheng (2025)

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DOI: 10.1109/ITC58126.2025.00082

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Ragad Al-Huq, Yuegui Zheng:
Test Bin Entitlement: Yield Outlier Detection using Die Area and LLM based Bin-Grouping. ITC 2025: 530-533

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