"Fault Tolerance in RRAM-based AI Accelerator with Guided Randomized ..."

Soyed Tuhin Ahmed et al. (2025)

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DOI: 10.1109/ITC58126.2025.00039

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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Soyed Tuhin Ahmed, Eduardo Ortega, Ryan Depsey, T. Patrick Xiao, Ben Feinberg, Christopher H. Bennett, Matthew J. Marinella, Krishnendu Chakrabarty:
Fault Tolerance in RRAM-based AI Accelerator with Guided Randomized Activation. ITC 2025: 320-329

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