"Functional Broadside Test Generation Using a Commercial ATPG Tool."

Naixing Wang et al. (2017)

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DOI: 10.1109/ISVLSI.2017.61

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-01

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  - https://dblp.org/rec/conf/isvlsi/WangYLP17
Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz:
Functional Broadside Test Generation Using a Commercial ATPG Tool. ISVLSI 2017: 308-313

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