"An All-Digital On-Chip Process-Control Monitor for Process-Variability ..."

Fabian Klass et al. (2008)

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DOI: 10.1109/ISSCC.2008.4523230

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Fabian Klass, Ashish Jain, Greg Hess, Brian Park:
An All-Digital On-Chip Process-Control Monitor for Process-Variability Measurements. ISSCC 2008: 408-409

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