"A new low power test pattern generator using a variable-length ring counter."

Bin Zhou et al. (2009)

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DOI: 10.1109/ISQED.2009.4810302

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/ZhouYLWK09
Bin Zhou, Yizheng Ye, Zhao-lin Li, Xin-chun Wu, Rui Ke:
A new low power test pattern generator using a variable-length ring counter. ISQED 2009: 248-252

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