"Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm ..."

Meng-Yen Wu, Meng-Hsueh Chiang (2016)

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DOI: 10.1109/ISQED.2016.7479195

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Meng-Yen Wu, Meng-Hsueh Chiang:
Performance evaluation of stacked gate-all-around MOSFETs at 7 and 10 nm technology nodes. ISQED 2016: 169-172

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